Sequential segregation of Sn and Sb in a Cu(111) single crystalASANTE, J. K. O; ROOS, W. D; TERBLANS, J. J et al.Surface and interface analysis. 2003, Vol 35, Num 5, pp 441-444, issn 0142-2421, 4 p.Article

Room-temperature oxidation of Fe(100), Fe(100)-3.5 wt.% MoN and segregated MoN: a mathematical analysisCONRADIE, R; ROOS, W. D; SWART, H. C et al.Surface and interface analysis. 2002, Vol 33, Num 8, pp 704-711, issn 0142-2421Article

Diffusion of silicon in Fe-based amorphous and crystalline alloys = Diffusion du silicium dans des alliages amorphes et cristallins à base de FeROOS, W. D; DU PLESSIS, J; VAN WYK, G. N et al.Applied surface science. 1989, Vol 40, Num 4, pp 303-307, issn 0169-4332Article

Silicon diffusion in an Fe-based amorphous alloy = Diffusion du silicium dans un alliage amorphe à base de FeVAN WYK, G. N; ROOS, W. D.Applied surface science. 1986, Vol 26, Num 3, pp 317-325, issn 0169-4332Article

Segregation of Sn in the binary CuSn and ternary CuSnSb alloy systemsASANTE, J. K. O; TERBLANS, J. J; ROOS, W. D et al.Surface and interface analysis. 2006, Vol 38, Num 9, pp 1249-1251, issn 0142-2421, 3 p.Article

Studies of carbon behaviour on GaN surface in ultra high vacuum (UHV)DIALE, M; AURET, F. D; ODENDAAL, R. Q et al.Surface and interface analysis. 2005, Vol 37, Num 13, pp 1158-1160, issn 0142-2421, 3 p.Article

Carbon Auger peak shape measurements in the characterization of reactions on (001) diamondVILJOEN, P. E; ROOS, W. D; SWART, H. C et al.Applied surface science. 1996, Vol 100-01, pp 612-616, issn 0169-4332Conference Paper

An AES study of Sn surface segregation in Cu single crystalsASANTE, J. K. O; TERBLANS, J. J; ROOS, W. D et al.Surface and interface analysis. 2005, Vol 37, Num 5, pp 517-521, issn 0142-2421, 5 p.Article

Analysis of GaN cleaning proceduresDIALE, M; AURET, F. D; VAN DER BERG, N. G et al.Applied surface science. 2005, Vol 246, Num 1-3, pp 279-289, issn 0169-4332, 11 p.Article

Segregation of Sn and Sb in a ternary Cu(1 0 0)SnSb alloyASANTE, J. K. O; TERBLANS, J. J; ROOS, W. D et al.Applied surface science. 2005, Vol 252, Num 5, pp 1674-1678, issn 0169-4332, 5 p.Article

ISS and AES studies of the initial oxidation of Dy, Tb and their silicidesBERNING, G. L. P; SWART, H. C; ROOS, W. D et al.Materials chemistry and physics. 1999, Vol 58, Num 1, pp 26-30, issn 0254-0584Article

Surface segregating kinetics in a ternary systemSWART, H. C; ROOS, W. D; TERBLANS, J. J et al.Surface and interface analysis. 2004, Vol 36, Num 4, pp 285-289, issn 0142-2421, 5 p.Article

The influence of a segregated MoN layer on the room temperature oxidation of a Fe(100)-3.5 wt.% Mo-N specimenCONRADIE, R; ROOS, W. D; SWART, H. C et al.Corrosion science. 2003, Vol 45, Num 2, pp 339-351, issn 0010-938XArticle

Quantification from overlapping Auger peak-to-peak heightsASANTE, J. K. O; ROOS, W. D; MARITZ, M. F et al.Surface and interface analysis. 2001, Vol 31, Num 9, pp 856-861, issn 0142-2421Article

On the degradation of ZnS:Cu, Al, Au phosphor powder: The effects of temperatureHILLIE, K. T; ROOS, W. D; SWART, H. C et al.Radiation effects and defects in solids. 2001, Vol 154, Num 3-4, pp 373-376, issn 1042-0150Conference Paper

A voltage control unit for ion scattering spectroscopy analyzersROOS, W. D; HENSON, R. P; VAN WYK, G. N et al.Review of scientific instruments. 1993, Vol 64, Num 4, pp 966-969, issn 0034-6748Article

Use of AES to determine sputter-induced concentration profiles in Cu-Ni alloysROOS, W. D; VAN WYK, G. N; DU PLESSIS, J et al.Surface and interface analysis. 1993, Vol 20, Num 1, pp 95-98, issn 0142-2421Article

The oxidation of terbium silicideBERNING, G. L. P; SWART, H. C; ROOS, W. D et al.Applied surface science. 1993, Vol 73, pp 305-309, issn 0169-4332Conference Paper

Influence of silicon on the oxidation of iron-based amorphous alloysROOS, W. D; VAN WYK, G. N.Journal of materials science. 1992, Vol 27, Num 5, pp 1193-1196, issn 0022-2461Article

The diffusion behaviour of Pb in yttium iron garnet filmsVAN WYK, G. N; PRIGGEMEYER, S; ROOS, W. D et al.Applied surface science. 1991, Vol 52, Num 4, pp 351-356, issn 0169-4332Article